ellipsometry Definition
a technique for measuring the thickness and optical properties of thin films on a substrate by analyzing the changes in polarization of light reflected from the surface.
Using ellipsometry: Examples
Take a moment to familiarize yourself with how "ellipsometry" can be used in various situations through the following examples!
Example
Ellipsometry is commonly used in the semiconductor industry to measure the thickness of thin films.
Example
The ellipsometry measurements showed that the film was uniform in thickness across the entire substrate.
Example
The accuracy of ellipsometry makes it a valuable tool in nanotechnology research.
Summary: ellipsometry in Brief
Ellipsometry [ih-lip-som-i-tree] is a technique used to measure the thickness and optical properties of thin films on a substrate. It works by analyzing the changes in polarization of light reflected from the surface. This method is commonly used in the semiconductor industry and nanotechnology research due to its accuracy.
